| 000 | 03620nlm1a2200505 4500 | ||
|---|---|---|---|
| 001 | 666049 | ||
| 005 | 20231030042024.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\37253 | ||
| 035 | _aRU\TPU\network\36539 | ||
| 090 | _a666049 | ||
| 100 | _a20211201a2021 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aKZ | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aElectromigration in lithium-titanium ferrite ceramics sintered in radiation-thermal mode _fA. P. Surzhikov, A. V. Malyshev, E. N. Lysenko [et al.] |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 320 | _a[References: 26 tit.] | ||
| 330 | _aThe study investigates electro-migration in Li–Ti ferrite ceramic samples sintered in radiation-thermal mode. To reveal radiation effects, similar measurements are performed for samples sintered in thermal mode. The effect of the state of grain boundaries and the presence of a low-melting additive on electrical properties of sintered ferrites is studied. It is found that structural rearrangement during radiation-thermal sintering occurs in early sintering stages, including the heating period. Study demonstrates that such behavior associated with radiation-induced intensification of the liquid phase spreading over the array of powder grains. In addition, it was shown that structural transformation may be caused by stimulation of intergranular slippage. | ||
| 461 | _tEurasian Physical Technical Journal | ||
| 463 |
_tVol. 18, No. 2 _v[P. 18-22] _d2021 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aelectrical resistance | |
| 610 | 1 | _aferrites | |
| 610 | 1 | _asintering | |
| 610 | 1 | _aelectron beams | |
| 610 | 1 | _agrain boundaries | |
| 610 | 1 | _alow-melting additive | |
| 610 | 1 | _aэлектросопротивление | |
| 610 | 1 | _aферриты | |
| 610 | 1 | _aспекание | |
| 610 | 1 | _aэлектронные пучки | |
| 701 | 1 |
_aSurzhikov _bA. P. _cphysicist _cProfessor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc) _f1951- _gAnatoly Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\30237 |
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| 701 | 1 |
_aMalyshev _bA. V. _cSpecialist in the field of electrical engineering _cSenior researcher at Tomsk Polytechnic University, Candidate of Physics and Mathematics (PhD Phys.-Math.) _f1978- _gAndrei Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\30965 |
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| 701 | 1 |
_aLysenko _bE. N. _cSpecialist in the field of electrical engineering _cHead of the laboratory of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1972- _gElena Nikolaevna _2stltpush _3(RuTPU)RU\TPU\pers\32050 |
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| 701 | 1 |
_aSheveleva _bE. A. _cspecialist in the field of electrical engineering _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1975- _gElena Aleksandrovna _2stltpush _3(RuTPU)RU\TPU\pers\42239 |
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| 701 | 1 |
_aStary _bO. _cSpecialist in the field of non-destructive testing _cSenior researcher of Tomsk Polytechnic University, Candidate of economic sciences _f1960- _gOldrich _2stltpush _3(RuTPU)RU\TPU\pers\45340 |
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| 701 | 1 |
_aGyngazov _bA. S. _gAleksandr Sergeevich |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение контроля и диагностики _h7978 _2stltpush _3(RuTPU)RU\TPU\col\23584 |
| 801 | 2 |
_aRU _b63413507 _c20211201 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.31489/2021No2/18-22 | |
| 942 | _cCF | ||