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100 _a20211223a2022 k y0engy50 ba
101 0 _aeng
102 _aNL
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aTalbot photolithography optimization with engineered hybrid metal-dielectric mask: High-contrast and highly-uniform Talbot stripes
_fYu. E. Geynts, I. V. Minin, O. V. Minin
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 32 tit.]
330 _aConventional projection Talbot lithography usually employs opaque (amplitude) or transparent (phase) masks for creating a periodic array of Fresnel diffraction fringes in the photosensitive substrate. For particular mask design the longitudinal periodicity of Talbot carpet can be avoided producing quasi uniform striped pattern (Talbot stripes). We propose a novel hybrid amplitude-phase mask which is engineered for obtaining extremely smooth Talbot stripes and simultaneously high lateral optical contrast and extreme spatial resolution better than a third of laser wavelength. By means of the numerical simulations, we demonstrate the robustness of produced striped diffraction patterns against mask design deviation and light incidence angle variations. The reproducibility of the Talbot stripes is reported also for 1D and 2D metal-dielectric projection masks.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tOptics and Laser Technology
463 _tVol. 148
_v[107776, 8 p.]
_d2022
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _aTalbot lithography
610 1 _awavelength-scaled diffraction grating
610 1 _aoptical contrast
610 1 _aprojection mask
610 1 _aлитография
610 1 _aдифракционные решетки
610 1 _aмасштабирование
610 1 _aоптический контраст
610 1 _aфотолитография
610 1 _aполосы Тальбота
700 1 _aGeynts
_bYu. E.
_gYury Elmarovich
701 1 _aMinin
_bI. V.
_cphysicist
_cProfessor of Tomsk Polytechnic University, Doctor of technical sciences
_f1960-
_gIgor Vladilenovich
_2stltpush
_3(RuTPU)RU\TPU\pers\37571
701 1 _aMinin
_bO. V.
_cphysicist
_cprofessor of Tomsk Polytechnic University, Doctor of technical sciences
_f1960-
_gOleg Vladilenovich
_2stltpush
_3(RuTPU)RU\TPU\pers\44941
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа неразрушающего контроля и безопасности
_bОтделение электронной инженерии
_h7977
_2stltpush
_3(RuTPU)RU\TPU\col\23507
801 2 _aRU
_b63413507
_c20211223
_gRCR
856 4 _uhttps://doi.org/10.1016/j.optlastec.2021.107776
942 _cCF