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001 666443
005 20231030042037.0
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100 _a20211224a2006 k y0engy50 ba
101 0 _aeng
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aSuccess factors for information technology supported international technology transfer: Finding expert consensus
_fN. Nahar, K. Lyytinen, N. Huda, S. V. Muravyov (Murav’ev)
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 43 tit.]
330 _aInformation technology (IT)-supported international technology transfer (ITT) is complex, risky, and fails often. No empirical studies are available on the factors that affect the success of IT-supported ITT. We review applicable theories (i.e. diffusion of innovation theory) and empirical research in conventional technology transfer to develop such a model. We carry out a multiple focus group method to rank factors that affect the success of IT-supported ITT and then apply a branch and bound method to derive a consensus ranking of these factors. The identified consensus ranking sheds light on factors that are similar to those of DOI theory and suggests a pattern of factors that affect IT-supported ITT.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tInformation & Management
463 _tVol. 43, iss. 5
_v[P. 663-677]
_d2006
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _asuccess factors
610 1 _aIT support
610 1 _aIT implementation
610 1 _ainternational technology transfer
610 1 _adiffusion of innovation
610 1 _aconsensus ranking
701 1 _aNahar
_bN.
_gNazmun
701 1 _aLyytinen
_bK.
_gKalle
701 1 _aHuda
_bN.
_gNajmul
701 1 _aMuravyov (Murav’ev)
_bS. V.
_cspecialist in the field of control and measurement equipment
_cProfessor of Tomsk Polytechnic University,Doctor of technical sciences
_f1954-
_gSergey Vasilyevich
_2stltpush
_3(RuTPU)RU\TPU\pers\31262
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bИнститут кибернетики (ИК)
_bКафедра компьютерных измерительных систем и метрологии (КИСМ)
_h66
_2stltpush
_3(RuTPU)RU\TPU\col\18706
801 2 _aRU
_b63413507
_c20211224
_gRCR
856 4 _uhttps://doi.org/10.1016/j.im.2005.02.002
942 _cCF