| 000 | 03358nlm1a2200505 4500 | ||
|---|---|---|---|
| 001 | 666462 | ||
| 005 | 20231030042038.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\37666 | ||
| 035 | _aRU\TPU\network\37299 | ||
| 090 | _a666462 | ||
| 100 | _a20211227a2022 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aUS | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aThin Wires and Edge Imaging Using Hard Bremsstrahlung Generated by a Microfocal Target of a Betatron _fM. M. Rychkov, V. V. Kaplin, V. A. Smolyanskiy |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 50 tit.] | ||
| 330 | _aThe magnified images of thin wires, plastic, steel and lead plates which were obtained using linear microfocus hard bremsstrahlung generated through interaction of an 18 MeV electron beam with a 13 [mu]m thick Ta foil oriented along the internal beam of a B-18 betatron are presented. The images indicate high absorption contrast of the objects due to a small horizontal size of the radiation source the width of which is 115-fold smaller than the diameter of the electron beam. Some results have shown a few peculiarities in the images which were not earlier observed. Several results were compared with the ones obtained earlier using the microfocus bremsstrahlung generated by the 18 MeV electron beam of B-18 in a narrow Si target. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | _tJournal of Nondestructive Evaluation | ||
| 463 |
_tVol. 41, iss. 1 _v[4, 10 p.] _d2022 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _abetatron | |
| 610 | 1 | _ainternal beam | |
| 610 | 1 | _anarrow target | |
| 610 | 1 | _abremsstrahlung | |
| 610 | 1 | _aangular distributions | |
| 610 | 1 | _amicrostructure images | |
| 610 | 1 | _aбетатроны | |
| 610 | 1 | _aбалки | |
| 610 | 1 | _aтормозные излучения | |
| 610 | 1 | _aугловые распределения | |
| 610 | 1 | _aизображения | |
| 610 | 1 | _aмикроструктуры | |
| 700 | 1 |
_aRychkov _bM. M. _cphysicist _cHead of the laboratory of Tomsk Polytechnic University, Candidate of technical sciences _f1977- _gMaksim Mikhailovich _2stltpush _3(RuTPU)RU\TPU\pers\32262 |
|
| 701 | 1 |
_aKaplin _bV. V. _cphysicist _csenior research fellow at Tomsk Polytechnic University _f1947- _gValery Viktorovich _2stltpush _3(RuTPU)RU\TPU\pers\31532 |
|
| 701 | 1 |
_aSmolyanskiy _bV. A. _cSpecialist in the field of instrument engineering _cResearcher, Tomsk Polytechnic University, Candidate of Technical Sciences _f1991- _gVladimir Aleksandrovich _2stltpush _3(RuTPU)RU\TPU\pers\38302 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bЦентр промышленной томографии _bНаучно-производственная лаборатория "Бетатронная томография крупногабаритных объектов" _h7983 _2stltpush _3(RuTPU)RU\TPU\col\23717 |
| 801 | 2 |
_aRU _b63413507 _c20211227 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1007/s10921-021-00825-2 | |
| 942 | _cCF | ||