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_aThe Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement _fS. G. Stuchebrov, A. A. Bulavskaya, A. A. Grigorieva (Grigorjeva), I. A. Miloichikova |
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_tElectron, Positron, Neutron and X–ray Scattering under External Influences _oInternational Conference, 18 –24 October 2021, Yerevan, Armenia _obook of abstracts _v[P. 67] _d2021 |
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_aStuchebrov _bS. G. _cphysicist _cAssociate Professor of Tomsk Polytechnic University, Candidate of Sciences _f1981- _gSergey Gennadevich _2stltpush _3(RuTPU)RU\TPU\pers\31559 |
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_aBulavskaya _bA. A. _cSpecialist in the field of nuclear technologies _cResearch Engineer of Tomsk Polytechnic University _f1993- _gAngelina Aleksandrovna _2stltpush _3(RuTPU)RU\TPU\pers\45898 |
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_aGrigorieva (Grigorjeva) _bA. A. _cnuclear technology specialist _cengineer of Tomsk Polytechnic University _f1995- _gAnna Anatoljevna _2stltpush _3(RuTPU)RU\TPU\pers\46746 |
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_aMiloichikova _bI. A. _cphysicist _cengineer of Tomsk Polytechnic University _f1988- _gIrina Alekseevna _2stltpush _3(RuTPU)RU\TPU\pers\35525 |
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