000 | 02506nlm1a2200433 4500 | ||
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001 | 666682 | ||
005 | 20231030042045.0 | ||
035 | _a(RuTPU)RU\TPU\network\37886 | ||
035 | _aRU\TPU\network\34848 | ||
090 | _a666682 | ||
100 | _a20220120a2021 k y0engy50 ba | ||
101 | 0 | _aeng | |
135 | _adrgn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aAccumulation of Defects in Polycrystalline Copper-Aluminum Solid Solutions and the Role of Stacking Fault Energy _fN. A. Koneva, L. I. Trishkina, T. V. Cherkasova [et al.] |
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203 |
_aText _celectronic |
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300 | _aTitle screen | ||
320 | _a[References: 14 tit.] | ||
330 | _aTransmission diffraction electron microscopy is used to study the evolution of a dislocation structure during active plastic deformation in copper-aluminum alloys in the 0-14 at % Al range of concentrations. Types of dislocation substructures are determined from micrographs, depending on the concentration of the alloying element. The parameters of the defect structure are measured and their relationship to stacking fault energy is established. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 | _tBulletin of the Russian Academy of Sciences: Physics | ||
463 |
_tVol. 85, iss. 9 _v[P. 937-940] _d2021 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
610 | 1 | _aдефекты | |
610 | 1 | _aполикристаллы | |
610 | 1 | _aмедь-алюминий | |
610 | 1 | _aэлектронная микроскопия | |
610 | 1 | _aпластические деформации | |
701 | 1 |
_aKoneva _bN. A. _gNina Aleksandrovna |
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701 | 1 |
_aTrishkina _bL. I. _gLyudmila Iljinichna |
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701 | 1 |
_aCherkasova _bT. V. _cphysicist _cSenior Lecturer of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1973- _gTatyana Viktorovna _2stltpush _3(RuTPU)RU\TPU\pers\46258 |
|
701 | 1 |
_aPopova _bN. A. _gNataljya Anatoljevna |
|
701 | 1 |
_aCherkasov _bN. V. _gNikita Vladislavovich |
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712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bШкола базовой инженерной подготовки _bОтделение естественных наук _h8032 _2stltpush _3(RuTPU)RU\TPU\col\23562 |
801 | 2 |
_aRU _b63413507 _c20220120 _gRCR |
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856 | 4 | _uhttps://doi.org/10.3103/S1062873821090197 | |
942 | _cCF |