| 000 | 04048nlm1a2200493 4500 | ||
|---|---|---|---|
| 001 | 666978 | ||
| 005 | 20231030042055.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\38182 | ||
| 035 | _aRU\TPU\network\20498 | ||
| 090 | _a666978 | ||
| 100 | _a20220209a2017 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aEffect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal _fA. R. Mkrtchan (Mkrtchyan), A. P. Potylitsyn, A. V. Vukolov [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 10 tit.] | ||
| 330 | _aThe spectra of X-ray diffraction from the reflecting atomic plane of a quartz single crystal are studied in Laue geometry under the action of temperature gradient on a BDER-KI-11K spectrometer with a resolution of 300 eV on the Am241 line of 17.74 keV. The temperature gradient leads to an increase in the intensity of the diffracted beam depending on the heating temperature. It is shown that the intensity of X-ray diffraction in Laue geometry may increase at a temperature gradient of 250○C/cm by two orders of magnitude in comparison with the uniform temperature state of the crystal. The rocking curve of the reflected beam is obtained at a fixed observation angle of 6○ and a specified temperature gradient. It is demonstrated that the intensity of the reflected beam increases with increasing temperature gradient (to a certain value), while the spectral width of the reflection line remains constant and is governed by the energy resolution of the spectrometer. A further growth in the temperature gradient leads to an increase in the spectral width of the reflection line with decreasing intensity of the reflected beam. | ||
| 461 | _tJournal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques | ||
| 463 |
_tVol. 11, iss. 6 _v[P. 1109-1112] _d2017 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aX-ray radiation | |
| 610 | 1 | _acrystal | |
| 610 | 1 | _aquartz | |
| 610 | 1 | _atemperature gradient | |
| 610 | 1 | _aрентгеновские излучения | |
| 610 | 1 | _aкристаллы | |
| 610 | 1 | _aкварц | |
| 610 | 1 | _aтемпературные градиенты | |
| 701 | 1 |
_aMkrtchan (Mkrtchyan) _bA. R. _cphysicist _cProfessor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences _f1937- _gAlpik Rafaelovich _2stltpush _3(RuTPU)RU\TPU\pers\34236 |
|
| 701 | 1 |
_aPotylitsyn _bA. P. _cRussian physicist _cProfessor of the TPU _f1945- _gAlexander Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\26306 |
|
| 701 | 1 |
_aVukolov _bA. V. _cphysicist _cResearch associate of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1978- _gArtem Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\31209 |
|
| 701 | 1 |
_aNovokshonov _bA. I. _gArtyom Igorevich |
|
| 701 | 1 |
_aGogolev _bA. S. _cphysicist _cassociate professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences _f1983- _gAleksey Sergeevich _2stltpush _3(RuTPU)RU\TPU\pers\31537 |
|
| 701 | 1 |
_aAmiragyan _bR. V. _gRuben |
|
| 701 | 1 |
_aMovsisyan _bA. E. |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИсследовательская школа физики высокоэнергетических процессов _c(2017- ) _h8118 _2stltpush _3(RuTPU)RU\TPU\col\23551 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bФизико-технический институт _bКафедра прикладной физики (№ 12) _bМеждународная научно-образовательная лаборатория "Рентгеновская оптика" _h7002 _2stltpush _3(RuTPU)RU\TPU\col\19530 |
| 801 | 2 |
_aRU _b63413507 _c20220209 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1134/S1027451017050111 | |
| 942 | _cCF | ||