| 000 | 03189nlm1a2200541 4500 | ||
|---|---|---|---|
| 001 | 667266 | ||
| 005 | 20231030042105.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\38471 | ||
| 035 | _aRU\TPU\network\38241 | ||
| 090 | _a667266 | ||
| 100 | _a20220311a2018 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aDiffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser _fO. Yu. Gorobtsov, N. Mukharamova, S. V. Lazarev [et al.] |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 320 | _a[References: 58 tit.] | ||
| 330 | _aX-ray free-electron lasers (XFELs) provide extremely bright and highly spatially coherent x-ray radiation with femtosecond pulse duration. Currently, they are widely used in biology and material science. Knowledge of the XFEL statistical properties during an experiment may be vitally important for the accurate interpretation of the results. Here, for the frst time, we demonstrate Hanbury Brown and Twiss (HBT) interferometry performed in difraction mode at an XFEL source. It allowed us to determine the XFEL statistical properties directly from the Bragg peaks originating from colloidal crystals. This approach is diferent from the traditional one when HBT interferometry is performed in the direct beam without a sample. Our analysis has demonstrated nearly full (80%) global spatial coherence of the XFEL pulses and an average pulse duration on the order of ten femtoseconds for the monochromatized beam, which is signifcantly shorter than expected from the electron bunch measurements. | ||
| 461 | _tScientific Reports | ||
| 463 |
_tVol. 8 _v[2219, 9 p.] _d2018 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aинтерферометрия | |
| 610 | 1 | _aрентгеновские лазеры | |
| 610 | 1 | _aрентгеновские излучения | |
| 610 | 1 | _aсвободные электроны | |
| 701 | 1 |
_aGorobtsov _bO. Yu. |
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| 701 | 1 |
_aMukharamova _bN. |
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| 701 | 1 |
_aLazarev _bS. V. _cphysicist _cengineer at Tomsk Polytechnic University _f1984- _gSergey Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\35210 |
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| 701 | 1 |
_aChollet _bM. |
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| 701 | 1 |
_aZhu _bD. |
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| 701 | 1 |
_aFeng _bY. |
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| 701 | 1 |
_aKurta _bR. P. |
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| 701 | 1 |
_aMeije _bJ. -M. |
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| 701 | 1 |
_aWilliams _bG. |
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| 701 | 1 |
_aSikorski _bM. |
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| 701 | 1 |
_aSong _bS. |
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| 701 | 1 |
_aDzhigaev _bD. |
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| 701 | 1 |
_aSerkez _bS. |
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| 701 | 1 |
_aSinger _bA. |
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| 701 | 1 |
_aPetukhov _bA. V. |
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| 701 | 1 |
_aVartanyants _bI. A. |
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| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bЦентр промышленной томографии _bМеждународная научно-образовательная лаборатория неразрушающего контроля _h6776 _2stltpush _3(RuTPU)RU\TPU\col\19961 |
| 801 | 2 |
_aRU _b63413507 _c20220311 _gRCR |
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| 856 | 4 | _uhttps://doi.org/10.1038/s41598-018-19793-1 | |
| 942 | _cCF | ||