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100 _a20220530a2021 k y0engy50 ba
101 0 _aeng
102 _aUS
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aElectromagnetic Methods for Testing Changes in Stress-Strain State of Dielectric Materials
_fA. A. Bespalko (Bespal'ko), D. D. Dann, M. V. Petrov [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 36 tit.]
330 _aWe consider complex methods for mechanical-electrical and acoustic-electrical testing of cracking under changes in the stress-strain state using the example of dielectric rock samples. The paper discusses the results of numerical and experimental studies of changes in the parameters of electromagnetic responses under a pulse deterministic acoustic excitation of rock samples with different compositions and textures and presents results of mathematical calculations of stress concentration on cracks located along the sample axis, perpendicular to which deterministic acoustic pulses were introduced. The results of experimental studies of electromagnetic emission of a sample containing calcite and magnetite under uniaxial compression up to fracture are shown. Regularities of changes in the amplitudes of electromagnetic signals during acoustic probing in the process of “stepwise” uniaxial loading by compression up to fracture are given.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tRussian Journal of Nondestructive Testing
463 _tVol. 57, iss. 10
_v[P. 865-876]
_d2021
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _anondestructive testing
610 1 _adielectric
610 1 _arock formation
610 1 _aacoustic impact
610 1 _aelectromagnetic emission
610 1 _aнеразрушающий контроль
610 1 _aдиэлектрики
610 1 _aгорные породы
610 1 _aакустическое воздействие
610 1 _aэлектромагнитное излучение
701 1 _aBespalko (Bespal'ko)
_bA. A.
_cphysicist
_cLeading researcher of Tomsk Polytechnic University, Candidate of physical and mathematical sciences
_f1948-
_gAnatoly Alekseevich
_2stltpush
_3(RuTPU)RU\TPU\pers\32243
701 1 _aDann
_bD. D.
_cspecialist in the field of electrical engineering
_cEngineer-researcher of Tomsk Polytechnic University
_f1987-
_gDenis Dmitrievich
_2stltpush
_3(RuTPU)RU\TPU\pers\32192
701 1 _aPetrov
_bM. V.
_cspecialist in the field of non-destructive testing
_cAssociate Scientist of Tomsk Polytechnic University
_f1992-
_gMaksim Vyacheslavovich
_2stltpush
_3(RuTPU)RU\TPU\pers\36439
701 1 _aPomishin
_bE. K.
_gEvgeny Karlovich
701 1 _aUtsyn
_bG. E.
_gGrigory Evgenjevich
701 1 _aFedotov
_bP. I.
_cspecialist in the field of electrical engineering
_cresearcher of Tomsk Polytechnic University
_f1982-
_gPavel Ivanovich
_2stltpush
_3(RuTPU)RU\TPU\pers\34571
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнститут неразрушающего контроля
_bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников
_h194
_2stltpush
_3(RuTPU)RU\TPU\col\19033
801 2 _aRU
_b63413507
_c20220530
_gRCR
856 4 _uhttps://doi.org/10.1134/S1061830921100028
942 _cCF