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001			668078
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100			_a20220606a2021 k y0engy50 ba
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181		0	_ai
182		0	_ab
200	1		_aInfluence of the Insulation Defects Size on the Value of the Wire Capacitance _fG. V. Vavilova, V. V. Yurchenko, Li Keyan
203			_aText _celectronic
300			_aTitle screen
320			_a[References: 31 tit.]
330			_aThe study focuses on detection of defects in the single-core electrical wire insulation by changing the linear capacity of the electric wire. Numerical simulation was performed to create defects that are difficult to implement in practice. In the study, models of the following defects were created: local thinning of the wire insulation, eccentricity, foreign inclusion in the wire insulation. During the study, the depth and length of the ‘local thinning’ defect in the wire insulation, the shift of the core center relative to wire the center, length and thickness of the ‘foreign inclusion’ defect were varied. As a result, absolute and relative values of the geometric dimensions of the defects that cause a significant change in the wire capacitance are revealed. A significant deviation of the capacitance is taken at the level of 5% deviation from the nominal value of the capacitance of a defect-free wire in accordance with the requirements of normative and technical documentation and the accuracy of device for in-process testing of the wire capacitance. The paper reports the results of the initial study. Further research is required to increase the reliability of the models used.
333			_aРежим доступа: по договору с организацией-держателем ресурса
461			_tProgress in Material Science and Engineering _feds. I. V. Minin, S. Uchaikin, A. Rogachev, O. Stary
463			_tVol. 351 : Studies in Systems, Decision and Control (SSDC) _v[P. 113-123] _d2021
610	1		_aэлектронный ресурс
610	1		_aтруды учёных ТПУ
700		1	_aVavilova _bG. V. _cspecialist in the field of non-destructive testing _cHead of Laboratory, Associate Professor of Tomsk Polytechnic University, Candidate of Technical Sciences _f1981- _gGalina Vasilievna _2stltpush _3(RuTPU)RU\TPU\pers\32607
701		1	_aYurchenko _bV. V. _gVladislav Vladimirovich
701		0	_aLi Keyan
712	0	2	_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение контроля и диагностики _h7978 _2stltpush _3(RuTPU)RU\TPU\col\23584
801		2	_aRU _b63413507 _c20220606 _gRCR
856	4		_uhttps://doi.org/10.1007/978-3-030-68103-6_11
942			_cCF