| 000 | 03337nlm1a2200481 4500 | ||
|---|---|---|---|
| 001 | 668571 | ||
| 005 | 20231030042153.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\39798 | ||
| 035 | _aRU\TPU\network\39724 | ||
| 090 | _a668571 | ||
| 100 | _a20221229a2022 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aNL | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aPractical limits of pulsed thermal NDT: The concept of additive/multiplicative noise _fV. P. Vavilov, A. O. Chulkov, V. V. Shiryaev |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 17 tit.] | ||
| 330 | _aThe approach to determining thermal nondestructive testing (TNDT) limits by defect parameters is presented on the base of the suggested concept of noise. The concept presumes that active TNDT limits are conditioned by the inherent noise, which can be conventionally classified for additive and multiplicative. It is shown that practical TNDT limits are associated with multiplicative noise, which can be conveniently expressed in terms of noise running contrast. Considering a certain interval of running contrast values adhered to a particular construction material can be useful when determining potentials of thermal NDT by minimal size and maximal depth of detected defects, for example, by using a simple analytical 1D model. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | _tNDT & E International | ||
| 463 |
_tVol. 130 _v[102677, 10 p.] _d2022 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _athermal nondestructive testing | |
| 610 | 1 | _aadditive and multiplicative noise | |
| 610 | 1 | _acontrast-to-noise ratio | |
| 610 | 1 | _adetection limit | |
| 610 | 1 | _adata processing | |
| 610 | 1 | _amodeling | |
| 610 | 1 | _aнеразрушающий контроль | |
| 610 | 1 | _aаддитивные шумы | |
| 610 | 1 | _aобработка данных | |
| 610 | 1 | _aмоделирование | |
| 700 | 1 |
_aVavilov _bV. P. _cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT) _cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) _f1949- _gVladimir Platonovich _2stltpush _3(RuTPU)RU\TPU\pers\32161 |
|
| 701 | 1 |
_aChulkov _bA. O. _cspecialist in the field of non-destructive testing _cEngineer of Tomsk Polytechnic University _f1989- _gArseniy Olegovich _2stltpush _3(RuTPU)RU\TPU\pers\32220 |
|
| 701 | 1 |
_aShiryaev _bV. V. _cspecialist in the field of non-destructive testing _cSenior researcher of Tomsk Polytechnic University, Candidate of technical sciences _f1948- _gVladimir Vasilyevich _2stltpush _3(RuTPU)RU\TPU\pers\32219 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bЦентр промышленной томографии _bНаучно-производственная лаборатория "Тепловой контроль" _h7984 _2stltpush _3(RuTPU)RU\TPU\col\23838 |
| 801 | 2 |
_aRU _b63413507 _c20221229 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1016/j.ndteint.2022.102677 | |
| 942 | _cCF | ||