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101 0 _aeng
102 _aUS
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181 0 _ai
182 0 _ab
200 1 _aAutomated detection and characterization of defects in composite-metal structures by using active infrared thermography
_fA. O. Chulkov, V. P. Vavilov, B. I. Shagdyrov, D. Kladov
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 21 tit.]
330 _aSeveral composite-metal samples with artificial defects of varying size and depth were experimentally investigated to demonstrate effectiveness of using a line scan thermographic nondestructive testing in combination with a neural network in the automated procedure of defect detection and characterization. The proposed data processing algorithm allowed defect thermal characterization with a practically accepted accuracy up to 16% and 51% by defect depth and thickness respectively. Characterization results were presented as distributions of defect depth and thickness correspondingly called depthgram and thicknessgram. For training a neural network, it was suggested to prepare input data in the form of non-stationary temperature profiles processed by using the thermographic signal reconstruction method.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tJournal of Nondestructive Evaluation
463 _tVol. 42, iss. 1
_v[20, 16 p.]
_d2023
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
610 1 _athermal NDT
610 1 _adefect characterization
610 1 _acomposite-metal structure
610 1 _aneural network
610 1 _aline scan thermography
701 1 _aChulkov
_bA. O.
_cspecialist in the field of non-destructive testing
_cDeputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences
_f1989-
_gArseniy Olegovich
_2stltpush
_3(RuTPU)RU\TPU\pers\32220
701 1 _aVavilov
_bV. P.
_cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT)
_cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)
_f1949-
_gVladimir Platonovich
_2stltpush
_3(RuTPU)RU\TPU\pers\32161
701 1 _aShagdyrov
_bB. I.
_cspecialist in the field of non-destructive testing
_cengineer of Tomsk Polytechnic University
_f1995-
_gBator Ilyich
_2stltpush
_3(RuTPU)RU\TPU\pers\47532
701 1 _aKladov
_bD.
_cspecialist in the field of non-destructive testing
_cengineer of Tomsk Polytechnic University
_f1996-
_gDmitry
_2stltpush
_3(RuTPU)RU\TPU\pers\47534
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа неразрушающего контроля и безопасности
_bЦентр промышленной томографии
_bНаучно-производственная лаборатория "Тепловой контроль"
_h7984
_2stltpush
_3(RuTPU)RU\TPU\col\23838
801 2 _aRU
_b63413507
_c20230310
_gRCR
856 4 _uhttps://doi.org/10.1007/s10921-023-00929-x
942 _cCF