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200 1 _aPhysical mechanisms of the influence of γ-ray surface treatment on the characteristics of close AuNi/n-n+-GaN Schottky contacts
_fN. A. Torkhov, A. V. Gradoboev, V. Budnaev [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: 63 tit.]
330 _aThe results obtained here suggest that low-dose 60Co γ-irradiation (Dγ∼ 140 Gy) has a complex effect on close AuNi/n-n+-GaN{0001} Schottky contacts. This manifests in the disappearance of current steps in the initial section of the forward current-voltage curve, improvement in the average values of the ideality factor n, a decrease in the average values of the true Schottky barrier height ϕbn in the middle section and an increase in series resistance RS and enhancement of the inhomogeneous metal-semiconductor contact series resistance effect in the final section. In all cases, the observed changes are sustainable. A combination of the Zur-McGill-Smith close Schottky contact defect model, the inhomogeneous contact model and the radiation-induced defect formation model provides an explanation for the physical mechanisms of changes observed in electrophysical and instrumental characteristics after γ-irradiation. Such mechanisms are associated with changes in the electrophysical nature of GaN structural defects (dislocations and interface states) and degradation of the homogeneity of contact conductivity. This paper shows that the low-temperature anomaly also manifests itself in close AuNi/n-n+-GaN Schottky contacts subjected to γ-irradiation.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tSemiconductor Science and Technology
463 _tVol. 37, iss. 10
_v[105005, 18 p.]
_d2022
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
701 1 _aTorkhov
_bN. A.
_gNikolay Aleksandrovich
701 1 _aGradoboev
_bA. V.
_cphysicist
_cProfessor of Yurga technological Institute of Tomsk Polytechnic University, Doctor of technical sciences
_f1952-
_gAleksandr Vasilyevich
_2stltpush
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701 1 _aBudnaev
_bV.
_gVadim
701 1 _aIvonin
_bI. V.
_gIvan Varfolomeevich
701 1 _aNovikov
_bV. A.
_gVadim Aleksandrovich
712 0 2 _aНациональный исследовательский Томский политехнический университет
_bИнженерная школа ядерных технологий
_bОтделение экспериментальной физики
_h7865
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856 4 0 _uhttps://doi.org/10.1088/1361-6641/ac7d71
942 _cCF