| 000 | 02982nlm1a2200373 4500 | ||
|---|---|---|---|
| 001 | 669620 | ||
| 005 | 20231030042229.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\40872 | ||
| 035 | _aRU\TPU\network\37576 | ||
| 090 | _a669620 | ||
| 100 | _a20230711a2023 k y0engy50 ba | ||
| 101 | 1 | _aeng | |
| 102 | _aUS | ||
| 135 | _adrgn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aLoss of the Emission Power in LEDs _fA. V. Gradoboev, K. N. Orlova, F. F. Zhamaldinov |
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| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[References: 21 tit.] | ||
| 330 | _aA classification of the radiation power losses of the LED active layer is proposed based on the analysis of the known literature data and the structure of structurally designed LEDs. Active and passive power losses are distinguished. Passive radiation power losses do not affect changes in the quantum yield of the active (working) layer of an LED and/or the forward branch of the volt–ampere characteristic, but they can be detected as anomalies in the LED lighting characteristics. A method for determining the passive power losses of radiation from the active layer of LEDs is proposed. Using the example of IR LEDs fabricated on the basis of AlGaAs heterostructures, the effectiveness of controlling passive losses of the LED emission power in the study of their operational properties is shown. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | _tInstruments and Experimental Techniques | ||
| 463 |
_tVol. 66, iss. 1 _v[P. 73-79] _d2023 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 700 | 1 |
_aGradoboev _bA. V. _cphysicist _cProfessor of Yurga technological Institute of Tomsk Polytechnic University, Doctor of technical sciences _f1952- _gAleksandr Vasilyevich _2stltpush _3(RuTPU)RU\TPU\pers\34242 |
|
| 701 | 1 |
_aOrlova _bK. N. _cphysicist _cAssociate Professor of Yurga technological Institute of Tomsk Polytechnic University, Candidate of technical sciences _f1985- _gKseniya Nikolaevna _2stltpush _3(RuTPU)RU\TPU\pers\33587 |
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| 701 | 1 |
_aZhamaldinov _bF. F. _gFail Firgatovich |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа ядерных технологий _bОтделение экспериментальной физики _h7865 _2stltpush _3(RuTPU)RU\TPU\col\23549 |
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет _bИнженерная школа неразрушающего контроля и безопасности _bОтделение контроля и диагностики _h7978 _2stltpush _3(RuTPU)RU\TPU\col\23584 |
| 801 | 2 |
_aRU _b63413507 _c20230711 _gRCR |
|
| 856 | 4 | _uhttps://doi.org/10.1134/S0020441222060112 | |
| 942 | _cCF | ||