APA

Adishchev Y. N., Verzilov V. A., Potylitsyn A. P., Uglov S. R. & Vorobiev S. A.Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal. : .

Chicago

Adishchev Yu N, Verzilov V A, Potylitsyn A P, Uglov S R and Vorobiev S A.Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal. : .

Harvard

Adishchev Y. N., Verzilov V. A., Potylitsyn A. P., Uglov S. R. and Vorobiev S. A.Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal. : .

MLA

Adishchev Yu N, Verzilov V A, Potylitsyn A P, Uglov S R and Vorobiev S A.: . .