APA

Grigoriev D., Lazarev S. V., Schroth P., Minkevich A., Kohl M., Slobodskyy T. P., Helfrich M., Schaadt D. M., Aschenbrenner T., Hommel D. & Baumbach T.Asymmetric skew X-ray diffraction at fixed incidence angle: application to semiconductor nano-objects. : .

Chicago

Grigoriev D, Lazarev S V, Schroth Ph, Minkevich A, Kohl M, Slobodskyy T P, Helfrich M, Schaadt D M, Aschenbrenner T, Hommel D and Baumbach T.Asymmetric skew X-ray diffraction at fixed incidence angle: application to semiconductor nano-objects. : .

Harvard

Grigoriev D., Lazarev S. V., Schroth P., Minkevich A., Kohl M., Slobodskyy T. P., Helfrich M., Schaadt D. M., Aschenbrenner T., Hommel D. and Baumbach T.Asymmetric skew X-ray diffraction at fixed incidence angle: application to semiconductor nano-objects. : .

MLA

Grigoriev D, Lazarev S V, Schroth Ph, Minkevich A, Kohl M, Slobodskyy T P, Helfrich M, Schaadt D M, Aschenbrenner T, Hommel D and Baumbach T.: . .