Application of secondary ion mass spectrometer for measuring the diffusion profiles in alkali-halide crystals / A. V. Chernyavski (Chernyavskiy), M. S. Kaz
Уровень набора: (RuTPU)RU\TPU\network\2008, IOP Conference Series: Materials Science and EngineeringЯзык: английский.Страна: .Резюме или реферат: Depth profiles of magnesium, fluorine and oxygen impurities was examined in the surface layers of alkali-halide KBr crystals using method of secondary ion mass spectrometry. Samples of potassium bromide, coated with a surface film of magnesium fluoride were subjected to isothermal diffusion annealing in air at various times. It is shown that the diffusion of O ions occurs from the ambient atmosphere besides the diffusion of Mg and F ions during annealing of KBr crystals. Accurate estimation of the diffusion coefficients of cationic impurity Mg requires taking into account the possible interaction of this impurity and oxygen..Примечания о наличии в документе библиографии/указателя: [References: 11 tit.].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | масс-спектрометры | диффузия | щелочно-галоидные кристаллы Ресурсы он-лайн:Щелкните здесь для доступа в онлайн | Щелкните здесь для доступа в онлайнTitle screen
[References: 11 tit.]
Depth profiles of magnesium, fluorine and oxygen impurities was examined in the surface layers of alkali-halide KBr crystals using method of secondary ion mass spectrometry. Samples of potassium bromide, coated with a surface film of magnesium fluoride were subjected to isothermal diffusion annealing in air at various times. It is shown that the diffusion of O ions occurs from the ambient atmosphere besides the diffusion of Mg and F ions during annealing of KBr crystals. Accurate estimation of the diffusion coefficients of cationic impurity Mg requires taking into account the possible interaction of this impurity and oxygen.
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