Distribution Functions for Internal Interface Energy as a Characteristic of Submicrocrystalline Copper Structure Evolution under Low-Temperature Annealing / P. V. Kuznetsov [et al.]
Уровень набора: (RuTPU)RU\TPU\network\4816, AIP Conference ProceedingsЯзык: английский.Резюме или реферат: Submicrocrystalline structure of 99.99% pure copper produced by equal channel angular pressing was under investigation. After deformation the samples were subjected to low-temperature annealing. Grain and subgrain structure was studied by scanning tunnel microscopy. Internal interface energy was estimated using the method based on measurement of dihedral angles (psi) of the boundary grooves formed by electrochemical etching. Analysis of the differential and cumulative distribution functions for relative grain boundary energy enabled to qualitatively evaluate energy redistribution between the boundaries of different types and internal bulk crystallites and to study evolution of submicrocrystalline structure under low-temperature annealing..Примечания о наличии в документе библиографии/указателя: [References: 6 tit.].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | функции распределения | интерфейсы | энергия | структуры | отжиг | сканирующая туннельная микроскопия | кристаллиты Ресурсы он-лайн:Щелкните здесь для доступа в онлайнTitle screen
[References: 6 tit.]
Submicrocrystalline structure of 99.99% pure copper produced by equal channel angular pressing was under investigation. After deformation the samples were subjected to low-temperature annealing. Grain and subgrain structure was studied by scanning tunnel microscopy. Internal interface energy was estimated using the method based on measurement of dihedral angles (psi) of the boundary grooves formed by electrochemical etching. Analysis of the differential and cumulative distribution functions for relative grain boundary energy enabled to qualitatively evaluate energy redistribution between the boundaries of different types and internal bulk crystallites and to study evolution of submicrocrystalline structure under low-temperature annealing.
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