Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography / A. I. Moskovchenko, M. Svantner, V. P. Vavilov, A. O. Chulkov

Уровень набора: MaterialsАльтернативный автор-лицо: Moskovchenko, A. I., Aleksey Igorevich;Svantner, M., Michal;Vavilov, V. P., Specialist in the field of dosimetry and methodology of nondestructive testing (NDT), Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU), 1949-, Vladimir Platonovich;Chulkov, A. O., specialist in the field of non-destructive testing, Engineer of Tomsk Polytechnic University, 1989-, Arseniy OlegovichКоллективный автор (вторичный): Национальный исследовательский Томский политехнический университет, Инженерная школа неразрушающего контроля и безопасности, Центр промышленной томографии, Международная научно-образовательная лаборатория неразрушающего контроляЯзык: английский.Страна: .Резюме или реферат: This study is focused on the quantitative estimation of defect depth by applying pulsed thermal nondestructive testing. The majority of known defect characterization techniques are based on 1D heat conduction solutions, thus being inappropriate for evaluating defects with low aspect ratios. A novel method for estimating defect depth is proposed by taking into account the phenomenon of 3D heat diffusion, finite lateral size of defects and the thermal reflection coefficient at the boundary between a host material and defects. The method is based on the combination of a known analytical model and a non-linear fitting (NLF) procedure. The algorithm was verified both numerically and experimentally on 3D-printed polylactic acid plastic samples. The accuracy of depth prediction using the proposed method was compared with the reference characterization technique based on thermographic signal reconstruction to demonstrate the efficiency of the proposed NLF method..Примечания о наличии в документе библиографии/указателя: [References: 35 tit.].Тематика: электронный ресурс | труды учёных ТПУ | pulse thermography | defect aspect ratio | thermal reflection coefficient | thermal NDT | defect characterization | non-linear fitting | thermographic signal reconstruction | термография | неразрушающий контроль | дефекты Ресурсы он-лайн:Щелкните здесь для доступа в онлайн | Щелкните здесь для доступа в онлайн
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[References: 35 tit.]

This study is focused on the quantitative estimation of defect depth by applying pulsed thermal nondestructive testing. The majority of known defect characterization techniques are based on 1D heat conduction solutions, thus being inappropriate for evaluating defects with low aspect ratios. A novel method for estimating defect depth is proposed by taking into account the phenomenon of 3D heat diffusion, finite lateral size of defects and the thermal reflection coefficient at the boundary between a host material and defects. The method is based on the combination of a known analytical model and a non-linear fitting (NLF) procedure. The algorithm was verified both numerically and experimentally on 3D-printed polylactic acid plastic samples. The accuracy of depth prediction using the proposed method was compared with the reference characterization technique based on thermographic signal reconstruction to demonstrate the efficiency of the proposed NLF method.

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